Arm-length-controlled CsPbBr₃ nanocrystals for tunable optical and assembly behavior
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Advanced materials - ISSN 0935-9648- (2026) p.
Secondary electron topographical contrast formation in scanning transmission electron microscopy
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Ultramicroscopy - ISSN 0304-3991-280 (2026) p. 1-6
Obtaining 3D atomic reconstructions from electron microscopy images using a Bayesian genetic algorithm : possibilities, insights, and limitations
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Microscopy and microanalysis - ISSN 1431-9276-31:1 (2024) p. 1-9