Optimized hyperdimensional edge AI evaluation for efficiency and reliability under real radiation

Source
ACM transactions on embedded computing systems - ISSN 1539-9087-25:1 (2026) p. 1-24
Author(s)

C-SMART : a preprocessor for neural network performance and reliability under radiation

Source
Microelectronics and reliability - ISSN 0026-2714-173 (2025) p. 1-11
Author(s)