Pattern matters : the impact of projection patterns on deep learning 3-D profilometry

Source
IEEE transactions on instrumentation and measurement - ISSN 0018-9456-74 (2025) p. 1-18
Author(s)

Deep learning for single-shot structured light profilometry : a comprehensive dataset and performance analysis

Source
Journal of Imaging - ISSN 2313-433X-10:8 (2024) p. 1-12
Author(s)