Wafer-scale synthesis of molecularly engineered 2D covalent organic framework films for highly-sensitive and rapid-response humidity sensing

Source
Advanced materials - ISSN 0935-9648-38:17 (2026) p. 1-15
Author(s)

Development of an Automated Electron Diffractometer for high throughput identification of nanocrystalline materials

Source
Antwerpen, University of Antwerp, Faculty of Science, 2025,x, 144 p.

Edge-Detected 4DSTEM-effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

Source
European physical journal: applied physics - ISSN 1286-0042-100 (2025) p. 1-10
Author(s)

Characterization of a Timepix detector for use in SEM acceleration voltage range

Source
Ultramicroscopy - ISSN 0304-3991-253 (2023) p. 1-6
Author(s)