An accurate DFT-1/2 approach for shallow defect states : efficient calculation of donor binding energies in silicon

Source
N P J Computational Materials - ISSN 2057-3960-12:1 (2026) p. 1-10
Author(s)

Decoupled DFT-$\frac{1}{2}$ method for defect excitation energies

Source
Physical review B - ISSN 2469-9950-108:12 (2023) p. 1-9